Measurement of minority carrier life time in germanium by photoconductive decay method (FOREIGN STANDARD)
standard by Japanese Industrial Standard / Japanese Standards Association, 01/01/1978

Measuring of minority-carrier lifetime in silicon single crystal by photoconductive decay method (FOREIGN STANDARD)
standard by Japanese Industrial Standard / Japanese Standards Association, 01/01/1995

Determination of conductivity type in germanium by thermoelectromotive method (FOREIGN STANDARD)
standard by Japanese Industrial Standard / Japanese Standards Association, 01/01/1978

Test methods of crystalline defects in silicon by preferential etch techniques (FOREIGN STANDARD)
standard by Japanese Industrial Standard / Japanese Standards Association, 01/01/1999

Method of measurement of etch pit density of germanium crystal (FOREIGN STANDARD)
standard by Japanese Industrial Standard / Japanese Standards Association, 01/01/1966

Methods for determination of copper in copper and copper alloys
standard by Japanese Industrial Standard / Japanese Standards Association, 01/01/2005

Methods for determination of arsenic in copper and copper alloys
standard by Japanese Industrial Standard / Japanese Standards Association, 01/01/2005

Method for determination of tellurium in copper (FOREIGN STANDARD)
standard by Japanese Industrial Standard / Japanese Standards Association, 01/01/1992

Method for determination of selenium in copper
standard by Japanese Industrial Standard / Japanese Standards Association, 01/01/1993